Scanning Probe Microscopy
Scanning Probe Microscopy (SPM) is a family of microscopy techniques that use a physical probe to scan a sample surface at the nanoscale, measuring local properties such as topography, electrical conductivity, or magnetic fields. It enables imaging and manipulation of surfaces with atomic or near-atomic resolution, far beyond the limits of optical microscopy. Common types include Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), which are widely used in materials science, nanotechnology, and biology.
Developers should learn SPM when working in fields like nanotechnology, semiconductor research, or materials engineering, as it provides critical insights into surface properties and nanostructures. It is essential for characterizing thin films, nanoparticles, or biological samples at high resolution, aiding in quality control, research, and development of advanced materials. Knowledge of SPM is valuable for roles involving instrumentation, data analysis, or interdisciplinary projects in physics, chemistry, or engineering.